4 results
VEELS Study of Boron and Nitrogen Doped Single Layer Graphene
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 743-744
- Print publication:
- August 2015
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Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1734-1735
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- August 2014
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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 618-619
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- August 2013
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Investigating the spatial distribution of plasmon modes in carbon cones
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1540-1541
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- July 2012
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